DocumentCode :
1051833
Title :
Thin-phase epitaxy for good semiconductor metal ohmic contacts
Author :
Sebestyen, Tibor ; Hartnagel, Hans L. ; Herron, Leonard H.
Author_Institution :
University of Newcastle upon Tyne, Merz Court, Newcastle upon Tyne, U. K.
Volume :
22
Issue :
12
fYear :
1975
fDate :
12/1/1975 12:00:00 AM
Firstpage :
1073
Lastpage :
1077
Abstract :
Ohmic contacts of superior quality are produced by treating the normal alloying process as an epitaxy process, where Ga and As are supplied separately by evaporation together with the normal contact metals and by overpressure, respectively. New device fabrication methods based on this new scheme are the production of shallow p-n junctions, shallow heterojunctions, thin ternary semiconductor layers with different bandgaps from that of the bulk, and multiple structures. By using photoresist, complete regrowth patterns as used for IC´s should be possible. The types of devices where these developments should be of interest are solar cells, light-emitting IC patterns, even with different light colors on one chip, Gunn devices, BARITT´s, MESFET´s, Schottky CCD´s, heterojunction bipolar transistors, etc.
Keywords :
Alloying; Epitaxial growth; Fabrication; Heterojunctions; Ohmic contacts; P-n junctions; Photonic band gap; Photovoltaic cells; Production; Resists;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18327
Filename :
1478162
Link To Document :
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