• DocumentCode
    105202
  • Title

    Characterization of Interlayer Sliding Deformation for Individual Multiwalled Carbon Nanotubes Using Electrostatically Actuated Nanotensile Testing Device

  • Author

    Hyun-Jin Oh ; Omori, Hideki ; Sadakata, Mitsutaka ; Tsubokura, Ikko ; Isono, Y.

  • Author_Institution
    Dept. of Mech. Eng., Kobe Univ., Kobe, Japan
  • Volume
    23
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    944
  • Lastpage
    954
  • Abstract
    We have developed an in situ scanning electron microscopy (SEM) nanomaterial manipulation system, including a newly designed electrostatically actuated nanotensile testing device (EANAT), in order to investigate the mechanical characteristics of multiwalled carbon nanotubes (MWCNTs) synthesized by atmospheric pressure-chemical vapor deposition. The new EANAT can measure uniaxial tensile displacement of nanomaterials using a capacitive displacement sensor incorporated into a cantilever motion amplification system. The resolution of the measurement displacement was 0.28 nm at the minimum. The nanomaterial manipulation system allows for an individual MWCNT to be picked up from a substrate and to be attached to an EANAT. The stress-strain relationships for the individual MWCNTs were successfully obtained from the nanotensile tests, and Young´s moduli were estimated to be in the range from 338 to 623 GPa. The deformation of individual MWCNTs under uniaxial loading was accompanied by repeated stick-slip and hard sticking events like telescopic motion. The shear strength at a stick-slip event during interlayer sliding of MWCNTs under tensile loading was directly derived from the shear interaction force in the tensile load-displacement curves and SEM observations. On the basis of the single-shot extraction model, the shear strength was estimated to be an average of 78 MPa greater than that for high-quality crystalline graphite, which might be caused by the hard sticking between layers.
  • Keywords
    Young´s modulus; chemical vapour deposition; deformation; nanofabrication; nanomechanics; scanning electron microscopy; shear strength; stick-slip; stress-strain relations; tensile testing; C; SEM nanomaterial manipulation system; Young´s moduli; cantilever motion amplification system; capacitive displacement sensor; chemical vapor deposition; electrostatically actuated nanotensile testing device; hard sticking event; high-quality crystalline graphite; interlayer sliding deformation; measurement displacement resolution; mechanical characteristics; multiwalled carbon nanotubes; repeated stick-slip event; scanning electron microscopy; shear interaction force; shear strength; single-shot extraction model; stress-strain relationships; telescopic motion; tensile load-displacement curves; tensile loading; uniaxial loading; uniaxial tensile displacement; Actuators; Capacitance; Capacitors; Displacement measurement; Scanning electron microscopy; Strain; Testing; Multiwalled carbon nanotube; capacitive displacement sensor; capacitive displacement sensor.; electrostatically actuated nanotensile testing; interlayer sliding; shear strength;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2014.2301849
  • Filename
    6742590