Title :
Emitter-junction temperature measurement under nonuniform current and temperature distribution
Author :
Alwin, V.C. ; Navon, David H.
Author_Institution :
University of Massachusetts, Amherst, MA
fDate :
1/1/1976 12:00:00 AM
Abstract :
A computer analysis of the temperature dependence of emitter junction voltage under an assumed nonuniform temperature distribution is presented, which demonstrates a temperature averaging effect when using junction voltage as an indicator of junction temperature.
Keywords :
Coils; Current measurement; Distributed computing; Lenses; Optical modulation; TV; Temperature dependence; Temperature distribution; Temperature measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1976.18351
