DocumentCode
1052118
Title
Confidence in VNA Measurements
Author
Ginley, R.A.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder
Volume
8
Issue
4
fYear
2007
Firstpage
54
Lastpage
58
Abstract
Making good, accurate measurements on modern VNAs can be a daunting task. There are many places to make mistakes and take inappropriate process steps. The ARFTG MCP offers participants a chance to compare the performance of their measurement process to those of other participants. Participation can bolster confidence in the measurement process as well as potentially identify unknown measurement problems. The only cost of participating is the time spent making measurements and the cost of shipping the kit to the next participant. VNA users are encouraged to participate in the ARFTG MCP or any other similar program.
Keywords
calibration; measurement systems; network analysers; ARFTG MCP; VNA measurements; VNA users; kit shipping cost; measurement problems; measurement process; vector network analyzer; Calibration; Connectors; Electromagnetic measurements; Frequency measurement; Instruments; Measurement standards; Particle measurements; Phase measurement; Scattering parameters; Testing;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMW.2007.383953
Filename
4271279
Link To Document