Title :
Confidence in VNA Measurements
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder
Abstract :
Making good, accurate measurements on modern VNAs can be a daunting task. There are many places to make mistakes and take inappropriate process steps. The ARFTG MCP offers participants a chance to compare the performance of their measurement process to those of other participants. Participation can bolster confidence in the measurement process as well as potentially identify unknown measurement problems. The only cost of participating is the time spent making measurements and the cost of shipping the kit to the next participant. VNA users are encouraged to participate in the ARFTG MCP or any other similar program.
Keywords :
calibration; measurement systems; network analysers; ARFTG MCP; VNA measurements; VNA users; kit shipping cost; measurement problems; measurement process; vector network analyzer; Calibration; Connectors; Electromagnetic measurements; Frequency measurement; Instruments; Measurement standards; Particle measurements; Phase measurement; Scattering parameters; Testing;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMW.2007.383953
