DocumentCode :
105229
Title :
Analytical Extraction of a Schottky Diode Model From Broadband S-Parameters
Author :
Aik Yean Tang ; Drakinskiy, Vladimir ; Yhland, K. ; Stenarson, J. ; Bryllert, Tomas ; Stake, Jan
Author_Institution :
Dept. of Microtechnol. & Nanosci. (MC2), Chalmers Univ. of Technol., Goteborg, Sweden
Volume :
61
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1870
Lastpage :
1878
Abstract :
We present an analytic method to extract Schottky diode parasitic model parameters. All the ten unknown model parameters are extracted via a straightforward step-by-step procedure. The challenges for a proper finger inductance and series resistance extraction are discussed and solutions are recommended. The proposed method is evaluated using three sets of S-parameter data for GaAs-based planar Schottky diodes, i.e., data from measurement up to 110 GHz and 3-D electromagnetic full-wave simulations up to 600 GHz. The extracted models agree well with the measured and simulated data.
Keywords :
III-V semiconductors; S-parameters; Schottky diodes; gallium arsenide; 3D electromagnetic full-wave simulation; GaAs; GaAs-based planar Schottky diode; Schottky diode parasitic model; broadband S-parameter; inductance; series resistance extraction; Analytical models; Capacitance; Integrated circuit modeling; Junctions; Mathematical model; Resistance; Schottky diodes; Analytical model; Schottky diodes; equivalent circuits; millimeter-wave devices; modeling; multibias; parameter extraction; scattering parameters; terahertz;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2013.2251655
Filename :
6485005
Link To Document :
بازگشت