• DocumentCode
    1052351
  • Title

    An accurate method for the determination of complex coefficients of single crystal piezoelectric resonators I: Theory

  • Author

    Du, Xiao-hong ; Wang, Qing-Ming ; Uchino, Kenji

  • Author_Institution
    Ramtron Int. Corp., Colorado Springs, CO, USA
  • Volume
    51
  • Issue
    2
  • fYear
    2004
  • Firstpage
    227
  • Lastpage
    237
  • Abstract
    This paper presents the theoretical derivation for a method of accurately determining the complex coefficients of single crystal piezoelectric materials. The vibration equations are analytically solved for a piezoelectric plate and a piezoelectric thin rod in an arbitrary crystallographic orientation. The solutions provide the distributions of the stresses and the vibration velocities inside the sample and the electrical impedance between the electrodes. Based on the analysis of the solutions, the complex dielectric, elastic, and piezoelectric coefficients are determined from the impedance or admittance measurements near the resonance frequencies. The measurement for LiNbO/sub 3/ single crystals is used as an example to demonstrate the experiment and calculation procedures and to indicate the comparisons with previous methods.
  • Keywords
    crystal orientation; crystal resonators; elastic constants; electric admittance; electric impedance; lithium compounds; permittivity; piezoelectric materials; vibrations; LiNbO/sub 3/; LiNbO/sub 3/ single crystals; admittance measurements; complex dielectric coefficients; crystallographic orientation; elastic coefficients; electrodes; impedance measurements; piezoelectric plate; piezoelectric thin rod; resonance frequencies; single crystal piezoelectric resonators; vibration equations; vibration velocities; Admittance measurement; Crystallography; Dielectrics; Electrodes; Equations; Impedance; Piezoelectric materials; Resonance; Resonant frequency; Stress;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2004.1320771
  • Filename
    1320771