DocumentCode :
1052403
Title :
A universal large/small signal 3-terminal FET model using a nonquasistatic charge-based approach
Author :
Daniels, Robert R. ; Yang, Andrew T. ; Harrang, Jeff P.
Author_Institution :
Boeing Aerosp. & Electron., Seattle, WA, USA
Volume :
40
Issue :
10
fYear :
1993
fDate :
10/1/1993 12:00:00 AM
Firstpage :
1723
Lastpage :
1729
Abstract :
Introduces a charge-based nonquasistatic large/small signal FET model that is extracted from measured small signal S-parameter and DC data and can be applied to an arbitrary three-terminal FET structure. The model is based on general physical principles, and provides consistent topologies for both large and small signal simulations to frequencies above ft and over a wide range of node voltages. The procedure for extracting model elements includes deembedding linear parasitic elements and extracting bicubic, B-spline functions, which represent large signal model elements. The spline coefficients are calculated using a constrained least squares fit to a set of small signal parameters and/or DC currents that have been measured at a number of node voltage values. Advantages of this approach include fast parameter extraction for new FET structures, accuracy, computational efficiency, charge conservation, and the requirement of only a single model for all simulation modes. The model can also be used to interface device simulators (e.g., PISCES) with circuit simulators for accurate predictive modeling
Keywords :
S-parameters; field effect transistors; least squares approximations; semiconductor device models; splines (mathematics); B-spline functions; DC data; PISCES; S-parameter; charge conservation; computational efficiency; constrained least squares fit; deembedding; large signal; linear parasitic elements; node voltages; nonquasistatic charge-based approach; predictive modeling; simulation modes; small signal; spline coefficients; three-terminal FET model; Circuit simulation; Computational modeling; Current measurement; Data mining; FETs; Frequency; Predictive models; Spline; Topology; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.277326
Filename :
277326
Link To Document :
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