DocumentCode :
1052444
Title :
Magnetic properties and internal stresses of thick vapor deposited permalloy films
Author :
Rogalla, Dietrich ; Ruh, Wolf-dieter
Author_Institution :
IBM Deutschland GmbH, Sindelfingen, Germany.
Volume :
9
Issue :
3
fYear :
1973
fDate :
9/1/1973 12:00:00 AM
Firstpage :
571
Lastpage :
574
Abstract :
10 000 Å thick 80/20 Ni-Fe films were deposited by e -beam evaporation on oxidized silicon wafers in a magnetic field. The dependencies of the internal stresses and of the magnetic properties on the substrate temperature and on the deposition rate were investigated. Measurements were done in the as deposited state and after a 5 h easy-axis anneal at 400°C. It turned out that both the magnetic properties and the internal stresses were strongly dependent on the kinetics of deposition. The observed field-induced magnetic anisotropy is entirely contributed to pair ordering. No interdependence between the uniaxial magnetic anisotropy and the internal stresses was found.
Keywords :
Permalloy films; Annealing; Internal stresses; Kinetic theory; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic properties; Semiconductor films; Silicon; Temperature dependence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1973.1067609
Filename :
1067609
Link To Document :
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