Behavior of insoluble materials in artificial contamination tests

Author

Ishii, M. ; Komatsubara, Minoru ; Matsuoka, Ryosuke ; Matsumoto, Takaie ; Kurokawa, Masaaki ; Naito, Katsuhiko

Author_Institution

Tokyo Univ., Japan

Volume

3

Issue

3

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

432

Lastpage

438

Abstract

It was reported that the dc flashover voltage under an artificial contamination test sometimes was affected considerably by the type of insoluble materials in the contaminant. To clarify the cause of this phenomenon, the physical characteristics of some contamination slurries and the conductivity of the artificially contaminated insulator surfaces are investigated experimentally. The test results lead to the conclusion that the variation in the flashover voltage is caused mainly by the characteristics of conductive films formed on the insulator surface in the clean fog test

Keywords

flashover; insulator contamination; insulator testing; surface conductivity; surface discharges; artificial contamination tests; clean fog test; conductive films; contamination slurries; dc flashover voltage; insoluble materials; insulator surface; insulator surfaces; physical characteristics; Conducting materials; Conductivity; Flashover; Insulation; Insulator testing; Materials testing; Slurries; Surface cleaning; Surface contamination; Voltage;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/94.506217

Filename

506217