DocumentCode :
1052736
Title :
Comments on numerical large-signal simulation of the diffusion noise in GaAs Gunn devices" [with reply]
Author :
Ghione, G. ; Wang, Bingdong ; Curow, M.
Author_Institution :
Dipartimento di Electronica, Politecnico di Torino, Italy
Volume :
40
Issue :
10
fYear :
1993
Firstpage :
1902
Lastpage :
1903
Abstract :
It is pointed out that a rigorous large-signal noise analysis of electron devices is possible, but is far more complex than the theory exploited in a previous paper by W. Wang and M.Curow (IEEE Trans. Electron Devices, vol ED-39, no.9, p.2176-8, 1992). Moreover, the impedance field used is only an approximation holding in a reciprocal medium, It is suggested that the original authors should at least discuss the validity of those approximations in the case considered. In their reply, Wang and Curow argue that the commenter misunderstood the intention and contents of their paper, since they do not claim that their simulation is a rigorous approach.<>
Keywords :
Gunn devices; III-V semiconductors; gallium arsenide; semiconductor device models; semiconductor device noise; simulation; solid-state microwave devices; GaAs; Gunn devices; diffusion noise; impedance field; numerical large-signal simulation; Circuit noise; Electron devices; Fluctuations; Frequency; Gallium arsenide; Gunn devices; Impedance; Microscopy; Numerical simulation; Transfer functions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.277358
Filename :
277358
Link To Document :
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