• DocumentCode
    1052736
  • Title

    Comments on numerical large-signal simulation of the diffusion noise in GaAs Gunn devices" [with reply]

  • Author

    Ghione, G. ; Wang, Bingdong ; Curow, M.

  • Author_Institution
    Dipartimento di Electronica, Politecnico di Torino, Italy
  • Volume
    40
  • Issue
    10
  • fYear
    1993
  • Firstpage
    1902
  • Lastpage
    1903
  • Abstract
    It is pointed out that a rigorous large-signal noise analysis of electron devices is possible, but is far more complex than the theory exploited in a previous paper by W. Wang and M.Curow (IEEE Trans. Electron Devices, vol ED-39, no.9, p.2176-8, 1992). Moreover, the impedance field used is only an approximation holding in a reciprocal medium, It is suggested that the original authors should at least discuss the validity of those approximations in the case considered. In their reply, Wang and Curow argue that the commenter misunderstood the intention and contents of their paper, since they do not claim that their simulation is a rigorous approach.<>
  • Keywords
    Gunn devices; III-V semiconductors; gallium arsenide; semiconductor device models; semiconductor device noise; simulation; solid-state microwave devices; GaAs; Gunn devices; diffusion noise; impedance field; numerical large-signal simulation; Circuit noise; Electron devices; Fluctuations; Frequency; Gallium arsenide; Gunn devices; Impedance; Microscopy; Numerical simulation; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.277358
  • Filename
    277358