DocumentCode :
1052834
Title :
Fabrication of highly transparent self-switching diodes using single layer indium tin oxide
Author :
Kettle, Jeff ; Perks, R.M. ; Hoyle, R.T.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester
Volume :
45
Issue :
1
fYear :
2009
Firstpage :
79
Lastpage :
81
Abstract :
The fabrication of a self-switching diode (SSD) from a single layer of n-type indium tin oxide [In2O3:Sn (ITO)] is reported. The material was grown using reactive thermal evaporation and nanostructured using a focused ion beam. The resultant device demonstrates strong current rectification, as well as a high threshold and breakdown voltage, owing to the higher density of states associated with the material, when compared to other reported SSD-device material. It is shown that this work could potentially lead to a range of new transparent devices based on ITO, without the need to develop high quality p-type material.
Keywords :
electronic density of states; focused ion beam technology; indium compounds; nanofabrication; rectification; semiconductor device breakdown; semiconductor diodes; semiconductor growth; semiconductor materials; semiconductor thin films; thin film devices; tin; vacuum deposition; In2O3:Sn; breakdown voltage; current rectification; density of states; focused ion beam; highly transparent self-switching diodes; reactive thermal evaporation; single layer; threshold;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20092309
Filename :
4733122
Link To Document :
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