Title :
Sub-μHz MOSFET 1/f noise measurements
Author :
Mandal, Srimanta ; Arfin, S.K. ; Sarpeshkar, Rahul
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA
Abstract :
The 1/f noise in integrated NMOS transistors at sub-muHz frequencies was measured by developing a simple and inexpensive common-mode noise-cancellation technique to attenuate the effects of temperature fluctuations. The noise has a power-law spectrum with slope -1.2 and an approximately Gaussian amplitude distribution.
Keywords :
Gaussian distribution; MOSFET; interference suppression; noise measurement; Gaussian amplitude distribution; common-mode noise-cancellation technique; integrated NMOS transistors; sub-muHz MOSFET; temperature fluctuations;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20092638
