DocumentCode
1052883
Title
Freeze-out effects on n-channel MOSFET´s
Author
Aymeloglu, Simeon ; Zemel, J.N. ; Zemel, Jay N.
Author_Institution
University of Pennsylvania, Philadelphia, PA
Volume
23
Issue
4
fYear
1976
fDate
4/1/1976 12:00:00 AM
Firstpage
466
Lastpage
470
Abstract
Surface admittance measurements have been carried out on
Keywords
Admittance measurement; Energy measurement; Frequency measurement; Impurities; Parasitic capacitance; Silicon; Temperature; Thermal expansion; Thermal stresses; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1976.18427
Filename
1478441
Link To Document