DocumentCode
1053020
Title
Frequency limits of GaAs and InP field-effect transistors at 300 K and 77 K with typical active-layer doping
Author
Maloney, T.J. ; Frey, Jeffrey
Author_Institution
Cornell University, Ithaca, NY
Volume
23
Issue
5
fYear
1976
fDate
5/1/1976 12:00:00 AM
Firstpage
519
Lastpage
519
Abstract
InP FET´s with active layer doping of 1017donors/ cm3have limiting values of fT roughly fifty per cent higher than those of equivalent GaAs devices for lengths ranging from 0.5 µm to 3 µm at 300 K, and from eighty percent to forty percent higher in this gate length range at 77 K.
Keywords
Diodes; Doping; Electron traps; FETs; Frequency; Gallium arsenide; Indium phosphide; Monte Carlo methods; Optical scattering; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1976.18440
Filename
1478454
Link To Document