• DocumentCode
    1053020
  • Title

    Frequency limits of GaAs and InP field-effect transistors at 300 K and 77 K with typical active-layer doping

  • Author

    Maloney, T.J. ; Frey, Jeffrey

  • Author_Institution
    Cornell University, Ithaca, NY
  • Volume
    23
  • Issue
    5
  • fYear
    1976
  • fDate
    5/1/1976 12:00:00 AM
  • Firstpage
    519
  • Lastpage
    519
  • Abstract
    InP FET´s with active layer doping of 1017donors/ cm3have limiting values of fTroughly fifty per cent higher than those of equivalent GaAs devices for lengths ranging from 0.5 µm to 3 µm at 300 K, and from eighty percent to forty percent higher in this gate length range at 77 K.
  • Keywords
    Diodes; Doping; Electron traps; FETs; Frequency; Gallium arsenide; Indium phosphide; Monte Carlo methods; Optical scattering; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18440
  • Filename
    1478454