DocumentCode
1053163
Title
A High Linearity, Fast-Locking Pulsewidth Control Loop With Digitally Programmable Duty Cycle Correction for Wide Range Operation
Author
Cheng, Kuo-Hsing ; Su, Chia-Wei ; Chang, Kai-Fei
Author_Institution
Nat. Central Univ., Taoyuan
Volume
43
Issue
2
fYear
2008
Firstpage
399
Lastpage
413
Abstract
A high linearity pulsewidth control loop (PWCL) is proposed in this paper. Using the linear control stage (CS) and digital-controlled charge pump (DCCP), the proposed PWCL can be operated within a wide-range of both input and output duty cycles over a wide frequency range. A simple detection circuit is utilized to control the DCCP in a complementary architecture such that the proposed PWCL can reduce the locking time ratio to 4.5. The test chip is fabricated using 0.18 mum CMOS process. The measurement results show that the frequency range of the input signal was 1 MHz to 1.3 GHz, the duty cycle range of the input signal is from 30% to 70% and the programmable duty cycle of the output signal is from 30% to 70% in steps of 5%. The measurement power dissipation and the peak-to-peak jitter are 4.8 mW and 13.2 ps, respectively, at an operating frequency of 1.3 GHz.
Keywords
CMOS digital integrated circuits; UHF integrated circuits; clocks; detector circuits; digital control; voltage multipliers; CMOS process; digital-controlled charge pump; digitally programmable duty cycle correction; fast-locking pulsewidth control loop; frequency 1.3 GHz; high linearity pulsewidth control loop; linear control stage; power 4.8 mW; size 0.18 mum; time 13.2 ps; CMOS process; Charge pumps; Circuit testing; Digital control; Frequency measurement; Linearity; Power dissipation; Power measurement; Semiconductor device measurement; Space vector pulse width modulation; Duty cycle detector (DCD); fast-locking; frequency detector (FD); linear constage stage (CS); programmable duty cycle; pulsewidth control loops (PWCL); time-to-digital converter (TDC); wide-range;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.914286
Filename
4444556
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