Title :
The influence of the topology of test circuits on the interrupting performance of circuit breakers
Author :
Schavemaker, P.H. ; van der Sluis, L.
Author_Institution :
Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands
fDate :
10/1/1995 12:00:00 AM
Abstract :
High-voltage circuit breakers are tested in the high power laboratory where transient recovery voltages (TRVs) are generated by networks consisting of lumped elements. In the IEC and ANSI standards. the TRV waveforms are described, but not the topology of the test circuits. This paper compares different direct TRV test circuits which generate the same initial part of the TRV waveform. It is demonstrated that the surge impedance of the TRV test circuit is an important parameter. The difference in interrupting performance of the test breaker in the test circuits with the different surge impedances is caused by the influence of the arc-circuit interaction
Keywords :
ANSI standards; arcs (electric); circuit-breaking arcs; network topology; switchgear testing; test equipment; ANSI standards; HV circuit breakers; IEC standards; arc-circuit interaction; high power laboratory; interrupting performance; surge impedance; test circuit topology; transient recovery voltages; Circuit breakers; Circuit testing; Circuit topology; Impedance; Laboratories; Network topology; Power generation; Surges; Transient analysis; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on