Title : 
A Low-Power SRAM Using Bit-Line Charge-Recycling
         
        
            Author : 
Kim, Keejong ; Mahmoodi, Hamid ; Roy, Kaushik
         
        
            Author_Institution : 
Purdue Univ., Lafayette
         
        
        
        
        
        
        
            Abstract : 
Low-power SRAM design is crucial since it takes a large fraction of total power and die area in high-performance processors. Reducing voltage swing of the bit-line is an effective way to save the power dissipation in write cycles. Voltage swing reduction of bit-lines is, however, limited due to possible write-failures. We propose a new low-power SRAM using bit-line charge recycling (CR-SRAM) for the write operation. In the proposed write scheme, differential voltage swing of a bit-line is obtained by recycled charge from its adjacent bit-line capacitance, instead of the power line. Applying such a charge recycling technique to the bit-line significantly reduces write power. A test chip with 32 Kbits (256 rows x 128 columns) is fabricated and measured in 0.13 mum CMOS to demonstrate operation of the proposed SRAM. Measurement results show 88% reduction in total power during write cycles compared to the conventional SRAM (CON-SRAM) at VDD = 1.5 V and f = 100 MHz.
         
        
            Keywords : 
CMOS digital integrated circuits; SRAM chips; logic design; low-power electronics; memory architecture; CMOS memory circuit; adjacent bit-line capacitance; bit-line charge-recycling; differential voltage swing; low-power SRAM design; size 0.13 micron; write cycles; write margin; write operation; write power; Capacitance; Circuits; Energy consumption; Low voltage; Power dissipation; Power measurement; Random access memory; Recycling; Semiconductor device measurement; Testing; Charge-recycling; SRAM; low power; process variation; write margin; write power;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2007.914294