• DocumentCode
    1053298
  • Title

    A historical perspective on the development of MOS transistors and related devices

  • Author

    Kahng, Dawon

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    23
  • Issue
    7
  • fYear
    1976
  • fDate
    7/1/1976 12:00:00 AM
  • Firstpage
    655
  • Lastpage
    657
  • Keywords
    Charge carrier density; Conductors; Explosions; Laboratories; MOSFETs; Marketing and sales; Surface impedance; Telephony; Thin film circuits; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18468
  • Filename
    1478482