Title :
Phosphorus doping of silicon by means of neutron irradiation
Author :
Haas, Ernst W. ; Schnöller, Manfred S.
Author_Institution :
Siemens AG, Munich, Germany
fDate :
8/1/1976 12:00:00 AM
Abstract :
Phosphorus doping of silicon with the aid of neutron irradiation is a very effective method to produce silicon single crystals with a homogeneous resistivity distribution and an exact average resistivity. The doping process is described and some aspects are given for the handling of the irradiated silicon. Experimental results concerning the resistivity distribution and the accuracy of aim are presented.
Keywords :
Conductivity; Crystals; Doping; Impurities; Inductors; Isotopes; Laboratories; Manufacturing; Neutrons; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1976.18488