DocumentCode :
1053488
Title :
Phosphorus doping of silicon by means of neutron irradiation
Author :
Haas, Ernst W. ; Schnöller, Manfred S.
Author_Institution :
Siemens AG, Munich, Germany
Volume :
23
Issue :
8
fYear :
1976
fDate :
8/1/1976 12:00:00 AM
Firstpage :
803
Lastpage :
805
Abstract :
Phosphorus doping of silicon with the aid of neutron irradiation is a very effective method to produce silicon single crystals with a homogeneous resistivity distribution and an exact average resistivity. The doping process is described and some aspects are given for the handling of the irradiated silicon. Experimental results concerning the resistivity distribution and the accuracy of aim are presented.
Keywords :
Conductivity; Crystals; Doping; Impurities; Inductors; Isotopes; Laboratories; Manufacturing; Neutrons; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1976.18488
Filename :
1478501
Link To Document :
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