Title :
Bias point selection in the importance sampling Monte Carlo simulation of systems
Author :
Bucklew, James A. ; Gubner, John A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
We consider the issue of whether it is better to bias the random variables at the input, at the output, or at some intermediate point of a system. We show that in a very general setting, the closer to the output that we can bias our system simulation variables, the better off we will be. We show that surprisingly, in some important special cases, the performance can be equal no matter where the bias point is selected. In the second part of the paper, we present a very general large deviation-type theorem on the variance rates of importance sampling estimators. We then use this theorem to consider, in a quantitative fashion, what the difference in the variance rates can be for input versus output formulations. We present several examples illustrating the developed theory.
Keywords :
digital simulation; importance sampling; parameter estimation; random processes; bias point selection; deviation-type theorem; importance sampling Monte Carlo simulation; importance sampling estimators; random variables bias; system simulation variables; variance rates; Analytical models; Computational modeling; Density measurement; Digital communication; Monte Carlo methods; Performance analysis; Random number generation; Random variables; Sampling methods; Stochastic systems;
Journal_Title :
Signal Processing, IEEE Transactions on
DOI :
10.1109/TSP.2002.806549