DocumentCode :
1053816
Title :
Calculation of two-dimensional temperature rise distribution in a thyristor
Author :
Terasawa, Yoshio ; Fukui, Hiroshi
Author_Institution :
Hitachi, Ltd., Ibaraki, Japan
Volume :
23
Issue :
8
fYear :
1976
fDate :
8/1/1976 12:00:00 AM
Firstpage :
980
Lastpage :
982
Abstract :
When a square-wave current flows through a thyristor, time variations of two-dimensional temperature rise distribution in the thyristor are calculated using a finite-difference method and the on-region of the n-base layer, which was measured by a microwave technique. The calculated result approximately agrees with the temperature rise distribution measured using an infrared microscope. It is shown that the position where temperature rise is highest moves away from the initial turn-on area with time.
Keywords :
Anodes; Current density; Delay effects; Finite difference methods; Switches; Switching circuits; Temperature distribution; Temperature measurement; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1976.18521
Filename :
1478534
Link To Document :
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