• DocumentCode
    1053816
  • Title

    Calculation of two-dimensional temperature rise distribution in a thyristor

  • Author

    Terasawa, Yoshio ; Fukui, Hiroshi

  • Author_Institution
    Hitachi, Ltd., Ibaraki, Japan
  • Volume
    23
  • Issue
    8
  • fYear
    1976
  • fDate
    8/1/1976 12:00:00 AM
  • Firstpage
    980
  • Lastpage
    982
  • Abstract
    When a square-wave current flows through a thyristor, time variations of two-dimensional temperature rise distribution in the thyristor are calculated using a finite-difference method and the on-region of the n-base layer, which was measured by a microwave technique. The calculated result approximately agrees with the temperature rise distribution measured using an infrared microscope. It is shown that the position where temperature rise is highest moves away from the initial turn-on area with time.
  • Keywords
    Anodes; Current density; Delay effects; Finite difference methods; Switches; Switching circuits; Temperature distribution; Temperature measurement; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18521
  • Filename
    1478534