Title :
Calculation of two-dimensional temperature rise distribution in a thyristor
Author :
Terasawa, Yoshio ; Fukui, Hiroshi
Author_Institution :
Hitachi, Ltd., Ibaraki, Japan
fDate :
8/1/1976 12:00:00 AM
Abstract :
When a square-wave current flows through a thyristor, time variations of two-dimensional temperature rise distribution in the thyristor are calculated using a finite-difference method and the on-region of the n-base layer, which was measured by a microwave technique. The calculated result approximately agrees with the temperature rise distribution measured using an infrared microscope. It is shown that the position where temperature rise is highest moves away from the initial turn-on area with time.
Keywords :
Anodes; Current density; Delay effects; Finite difference methods; Switches; Switching circuits; Temperature distribution; Temperature measurement; Thyristors; Voltage control;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1976.18521