DocumentCode
1053816
Title
Calculation of two-dimensional temperature rise distribution in a thyristor
Author
Terasawa, Yoshio ; Fukui, Hiroshi
Author_Institution
Hitachi, Ltd., Ibaraki, Japan
Volume
23
Issue
8
fYear
1976
fDate
8/1/1976 12:00:00 AM
Firstpage
980
Lastpage
982
Abstract
When a square-wave current flows through a thyristor, time variations of two-dimensional temperature rise distribution in the thyristor are calculated using a finite-difference method and the on-region of the n-base layer, which was measured by a microwave technique. The calculated result approximately agrees with the temperature rise distribution measured using an infrared microscope. It is shown that the position where temperature rise is highest moves away from the initial turn-on area with time.
Keywords
Anodes; Current density; Delay effects; Finite difference methods; Switches; Switching circuits; Temperature distribution; Temperature measurement; Thyristors; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1976.18521
Filename
1478534
Link To Document