Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

Author

Labussiere-Dorgan, C. ; Bendhia, Sonia ; Sicard, Etienne ; Tao, Junwu ; Quaresma, Henrique Jorge ; Lochot, Christophe ; Vrignon, Bertrand

Author_Institution

Centre d´´Essais Aeronautique de Toulouse, Toulouse

Volume

50

Issue

1

fYear

2008

Firstpage

22

Lastpage

34

Abstract

This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions of a commercial 16-bit microcontroller. The emission measurements are performed according to several EM compatibility standards, namely, 1 Omega /150 Omega , surface scan, and transverse EM/gigahertz transverse EM (GTEM) method, and their results show an excellent fit with model predictions.

Keywords

electromagnetic compatibility; integrated circuit design; microcontrollers; 16-bit microcontroller; electromagnetic compatibility; electromagnetic emission compatibility standard; integrated circuit behavioral model; Electromagnetic measurements; Electromagnetic modeling; Integrated circuit measurements; Integrated circuit modeling; Measurement standards; Microcontrollers; Performance evaluation; Predictive models; Scattering parameters; Surface fitting; Conducted emission; electromagnetic compatibility (EMC); integrated circuit (IC); integrated circuit emission model (ICEM); measurement standards; microcontroller; radiated emission;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2007.911918

Filename

4444637