Title :
Intensity noise characteristics of a Mach-Zehnder wavelength converter
Author :
Pan, X. ; Koch, T.L.
Author_Institution :
AT&T Bell Labs., Holmdel, NJ, USA
Abstract :
Wavelength conversion using semiconductor optical amplifiers in a Mach-Zehnder configuration is analyzed. It is shown that the wavelength converter has strong influence on the intensity noise of the converted channel. Ways of improving the noise performance of the wavelength converter are discussed.<>
Keywords :
Mach-Zehnder interferometers; laser noise; light interferometers; multiplexing equipment; optical frequency conversion; semiconductor device noise; semiconductor lasers; wavelength division multiplexing; Mach-Zehnder configuration; Mach-Zehnder wavelength converter; WDM optical networks; converted channel; intensity noise; intensity noise characteristics; noise performance; semiconductor optical amplifiers; wavelength conversion; Delay; Optical filters; Optical interferometry; Optical noise; Optical wavelength conversion; Probes; Semiconductor device noise; Semiconductor optical amplifiers; Stimulated emission; Wavelength conversion;
Journal_Title :
Photonics Technology Letters, IEEE
