• DocumentCode
    1054135
  • Title

    Improvement of Interpixel Uniformity in Carbon Nanotube Field Emission Display by Luminance Correction Circuit

  • Author

    Kang, Mun-Seok ; Yun, Young-Jun ; Lee, Chul-Ho ; Lee, Jung-Won ; Choe, Deok-Hyeon ; Baek, Kwang-Hyun ; Kim, Suki

  • Author_Institution
    Korea Univ., Seoul
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    768
  • Lastpage
    773
  • Abstract
    Interpixel uniformity is critical to image quality, and is hard to be improved by structural reformation of emissive elements because of nonuniformity in luminance characteristics of subpixels in self-emissive device like the carbon nanotube field emission display (CNT-FED). In this paper, we discuss the improvement of the interpixel uniformity by individually controlling the luminance of all subpixels in a display panel. We propose a prototype CNT-FED with improved interpixel uniformity using luminance correction circuitry. The analysis of interpixel uniformity with the proposed luminance correction circuit shows that the index of interpixel uniformity increases about 8% with only about 10% luminance reduction ratio that is a relatively small penalty compared to the enhancement of the interpixel uniformity. The proposed correction method can also be used to ensure improvement of the interpixel uniformity in large-size CNT-FED panels.
  • Keywords
    carbon nanotubes; field emission displays; nanoelectronics; C; CNT-FED panels; carbon nanotube field emission display; emissive elements; image quality; interpixel uniformity; luminance characteristics; luminance correction circuit; structural reformation; Carbon nanotubes; Cathode ray tubes; Circuits; Design engineering; Flat panel displays; HDTV; Image quality; Nanoscale devices; Prototypes; Signal processing; Carbon nanotube field emission display (CNT-FED); interpixel uniformity; luminance correction circuit; self-emissive device;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.915055
  • Filename
    4444642