• DocumentCode
    1054240
  • Title

    Trigger reliability of xenon flashlamps

  • Author

    Hug, William F. ; Lee, Robert C.

  • Author_Institution
    Xerox Electro-Optical Systems, Pasadena, CA
  • Volume
    23
  • Issue
    10
  • fYear
    1976
  • fDate
    10/1/1976 12:00:00 AM
  • Firstpage
    1166
  • Lastpage
    1169
  • Abstract
    The probability that a trigger pulse will successfully allow a driver circuit to discharge its energy through a xenon flashlamp is discussed. Based on a classical description of trigger spark formation and propagation statistics, the misflash probability, Pm, is described in terms of the ionization rate in the flash-lamp, β; the trigger pulsewidth, te; and the normalized trigger pulse overvoltage (Vs- Vst)/Vdc. This model was experimentally validated for series and parallel trigger circuits over a broad range of trigger pulse voltages, Vs, and pulseforming network voltages, VB.
  • Keywords
    Driver circuits; Ionization; Probability; Pulse circuits; Space vector pulse width modulation; Sparks; Statistics; Trigger circuits; Voltage control; Xenon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18563
  • Filename
    1478576