DocumentCode
1054240
Title
Trigger reliability of xenon flashlamps
Author
Hug, William F. ; Lee, Robert C.
Author_Institution
Xerox Electro-Optical Systems, Pasadena, CA
Volume
23
Issue
10
fYear
1976
fDate
10/1/1976 12:00:00 AM
Firstpage
1166
Lastpage
1169
Abstract
The probability that a trigger pulse will successfully allow a driver circuit to discharge its energy through a xenon flashlamp is discussed. Based on a classical description of trigger spark formation and propagation statistics, the misflash probability, Pm , is described in terms of the ionization rate in the flash-lamp, β; the trigger pulsewidth, te ; and the normalized trigger pulse overvoltage (Vs - Vst )/Vdc . This model was experimentally validated for series and parallel trigger circuits over a broad range of trigger pulse voltages, Vs , and pulseforming network voltages, VB .
Keywords
Driver circuits; Ionization; Probability; Pulse circuits; Space vector pulse width modulation; Sparks; Statistics; Trigger circuits; Voltage control; Xenon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1976.18563
Filename
1478576
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