• DocumentCode
    1054268
  • Title

    Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor

  • Author

    Velazco, R. ; Karoui, S. ; Chapuis, T. ; Benezech, D. ; Rosier, L.H.

  • Volume
    39
  • Issue
    3
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    436
  • Lastpage
    440
  • Abstract
    The authors present a set of techniques making it possible to perform heavy-ion testing on present 32-bit microprocessors. In particular, they study how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as a Cf252 fission-decay source
  • Keywords
    integrated circuit testing; ion beam effects; microprocessor chips; satellite computers; 32-bit microprocessors; 68020 microprocessor; 68882 coprocessor; Cf252 fission-decay source; Motorola; experimental results; heavy-ion testing; particle accelerators; program dependent cross-section; set of techniques; space environment; upset cross-section; Circuit testing; Coprocessors; Digital systems; Linear particle accelerator; Microprocessors; Performance evaluation; Radiation detectors; Registers; Single event upset; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.277533
  • Filename
    277533
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1054268