• DocumentCode
    1054407
  • Title

    Insulator-surface flashover conditioning: A streak photographic investigation

  • Author

    Asokan, T. ; Sudarshan, T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
  • Volume
    21
  • Issue
    3
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    298
  • Lastpage
    304
  • Abstract
    Conditioning behavior of surface flashover strength of a large-bandgap insulator (quartz) is investigated with the aid of streak photography in conjunction with electrical (voltage and current) and optical UV (phototube) diagnostics. The breakdown strength of the sample is found to be conditioned during the initial test as well as the subsequent test, performed after an overnight rest period. The results suggest that light emission during the initial test is dominated by visible light whereas during the subsequent test it is dominated by UV. The initial conditioning is attributed primarily to the desorption of absorbed molecules and rearrangement of the same by migration kinetics. Processes such as negative charge formation on the insulator surface and trapping of electrons in the deep traps are proposed to be responsible for the observed conditioning after the overnight rest period. The breakdown strength of the sample was found to degrade after experiencing breakdown at higher fields (i.e., after second day test). This deconditioning behavior is discussed in terms of evaporation of electrode material and deposition of the same on the insulator near the cathode end
  • Keywords
    electric breakdown of solids; flashover; plasma diagnostics; quartz; streak photography; surface discharges; SiO2; UV diagnostics; absorbed molecules; breakdown strength; cathode end; current; deconditioning behavior; deep traps; desorption; electrical diagnostics; electrode material; electron trapping; evaporation; insulator surface; large-bandgap insulator; light emission; migration kinetics; molecular rearrangement; negative charge formation; phototube; quartz; streak photographic investigation; surface flashover strength; visible light; voltage; Dielectrics and electrical insulation; Electric breakdown; Electron traps; Flashover; Performance evaluation; Photoelectricity; Photography; Stimulated emission; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.277555
  • Filename
    277555