DocumentCode
1054407
Title
Insulator-surface flashover conditioning: A streak photographic investigation
Author
Asokan, T. ; Sudarshan, T.
Author_Institution
Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
Volume
21
Issue
3
fYear
1993
fDate
6/1/1993 12:00:00 AM
Firstpage
298
Lastpage
304
Abstract
Conditioning behavior of surface flashover strength of a large-bandgap insulator (quartz) is investigated with the aid of streak photography in conjunction with electrical (voltage and current) and optical UV (phototube) diagnostics. The breakdown strength of the sample is found to be conditioned during the initial test as well as the subsequent test, performed after an overnight rest period. The results suggest that light emission during the initial test is dominated by visible light whereas during the subsequent test it is dominated by UV. The initial conditioning is attributed primarily to the desorption of absorbed molecules and rearrangement of the same by migration kinetics. Processes such as negative charge formation on the insulator surface and trapping of electrons in the deep traps are proposed to be responsible for the observed conditioning after the overnight rest period. The breakdown strength of the sample was found to degrade after experiencing breakdown at higher fields (i.e., after second day test). This deconditioning behavior is discussed in terms of evaporation of electrode material and deposition of the same on the insulator near the cathode end
Keywords
electric breakdown of solids; flashover; plasma diagnostics; quartz; streak photography; surface discharges; SiO2; UV diagnostics; absorbed molecules; breakdown strength; cathode end; current; deconditioning behavior; deep traps; desorption; electrical diagnostics; electrode material; electron trapping; evaporation; insulator surface; large-bandgap insulator; light emission; migration kinetics; molecular rearrangement; negative charge formation; phototube; quartz; streak photographic investigation; surface flashover strength; visible light; voltage; Dielectrics and electrical insulation; Electric breakdown; Electron traps; Flashover; Performance evaluation; Photoelectricity; Photography; Stimulated emission; Testing; Voltage;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.277555
Filename
277555
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