DocumentCode :
1054424
Title :
Avalanche injection in high-speed thyristors
Author :
Kardo-Sysoev, A.F. ; Reshetin, V.P. ; Tchashnikov, I.G. ; Shuman, V.B.
Author_Institution :
A. F. Ioffe Physico-Technical Institute, Leningrad, USSR
Volume :
23
Issue :
11
fYear :
1976
fDate :
11/1/1976 12:00:00 AM
Firstpage :
1208
Lastpage :
1211
Abstract :
The aim of the present paper is to show the possibility of designing high-power semiconductor switches the turn-on time of which is as short as that of hydrogen thyratrons. These devices switch pulses of 105W with turn-on times in the nanosecond range. In the OFF state all the voltage applied to a semiconductor switch is concentrated on the space-charge region (SCR) where there are assumed to be no free carriers. The process of switching into the ON state in a conventional thyristor switching mechanism is to fill the SCR with free electrons and holes injected from emitters by diffusion through base regions. The generation of carriers due to impact ionization in the SCR during the whole transition process accelerates switching. The avalanche injection (AI) suggested by Gunn [1] in diodes is the process providing impact ionization despite the voltage decrease in the device during its switching. At first we consider simplified AI processes and their potentialities in three-layer structures. Then the results are extended to more complex four- and five-layer structures by including the gate current. At the end the experimental data are given.
Keywords :
Artificial intelligence; Charge carrier processes; Electron emission; Hydrogen; Impact ionization; Nanoscale devices; Switches; Thyratrons; Thyristors; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1976.18580
Filename :
1478593
Link To Document :
بازگشت