DocumentCode :
1054475
Title :
Theoretical and experimental investigations on the process of high-pressure discharge development
Author :
Novak, Jaroslav P. ; Bartnikas, Ray
Author_Institution :
Inst. de Recherche d´´Hydro-Quebec, Varennes, Que., Canada
Volume :
19
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
95
Lastpage :
101
Abstract :
The voltage breakdown behavior of a plane-parallel gap of 0.48-mm length filled with helium was examined at atmospheric pressure with admixtures of dry air at relative pressures of 0, 10-4, 3×10-4, and 10-3. The initial stages of the breakdown were investigated by means of a quantitative model consisting of the electron, ion, and excited-particle conservation equations and the Poisson equation. The system of equations was solved for an applied voltage of 180 V, at one single partial pressure of the impurities. Two numerical routines were used for the solution: a commercial IMSL subroutine TWODEPEP, and a newly developed method of solution in several fractional steps. The results were compared and found to be in reasonable agreement although the new method indicated a somewhat slower rate of rise, particularly concerning electron density. The new method permits extension of the calculation up to electron densities equal to almost two orders of magnitude above the earlier limit
Keywords :
discharges (electric); electric breakdown of gases; helium; 180 V; He; IMSL subroutine TWODEPEP; Poisson equation; dry air admixture; electron conservation equations; electron density; excited-particle conservation equations; high-pressure discharge development; impurities; ion conservation equations; plane-parallel gap; quantitative model; voltage breakdown behavior; Algorithms; Atmospheric measurements; Atmospheric modeling; Breakdown voltage; Current measurement; Electric breakdown; Electrons; Helium; Poisson equations; Surges;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.106802
Filename :
106802
Link To Document :
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