DocumentCode
1054654
Title
Advances in Computation of the Maximum of a Set of Gaussian Random Variables
Author
Sinha, Debjit ; Zhou, Hai ; Shenoy, Narendra V.
Author_Institution
IBM Microelectron., Hopewell Junction
Volume
26
Issue
8
fYear
2007
Firstpage
1522
Lastpage
1533
Abstract
This paper quantifies the approximation error when results obtained by Clark (1961) are employed to compute the maximum (max) of Gaussian random variables, which is a fundamental operation in statistical timing. We show that a finite lookup table can be used to store these errors. Based on the error computations, approaches to different orderings for pairwise max operations on a set of Gaussians are proposed. Experimental results show accuracy improvements in the computation of the max of multiple Gaussians, in comparison to the traditional approach. In addition, we present an approach to compute the tightness probabilities of Gaussian random variables with dynamic runtime-accuracy tradeoff options. We replace required numerical computations for their estimations by closed form expressions based on Taylor series expansion that involve table lookup and a few fundamental arithmetic operations. Experimental results demonstrate an average speedup of 2 using our approach for computing the maximum of two Gaussians, in comparison to the traditional approach, without any accuracy penalty.
Keywords
CAD; Gaussian processes; VLSI; electronic engineering computing; random processes; series (mathematics); table lookup; timing circuits; Gaussian random variables; Taylor series expansion; approximation error; error computations; finite lookup table; multiple Gaussians; pairwise max operations; statistical timing; Approximation error; Arithmetic; Circuits; Design automation; Gaussian approximation; Random variables; Table lookup; Taylor series; Timing; Very large scale integration; Computer-aided design (CAD); Gaussian approximation; statistical timing; very large-scale integration (VLSI);
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2007.893544
Filename
4271562
Link To Document