• DocumentCode
    1054758
  • Title

    A Model for Wafer Fabrication Dynamics in Integrated Circuit Manufacturing

  • Author

    Dayhoff, Judith E. ; Atherton, Robert W.

  • Author_Institution
    Judith Dayhoff & Associates, Inc., Box 4029, Mountain View, CA 94040, USA
  • Volume
    17
  • Issue
    1
  • fYear
    1987
  • Firstpage
    91
  • Lastpage
    100
  • Abstract
    Integrated circuit manufacturing has major operations of fabrication, sort, assembly, and test. The dynamic behavior of these operations can be modeled in terms of a highly structured queueing network. A model is presented of the components and interactions of wafer movements, processing equipment, and process steps. The model considers multiple process flows, fab organization and layout, and equipment properties such as batch size, process time, failure, and repair distributions. The model is implemented as a discrete event simulation and has been used in a number of case studies concerning realistic factory situations. This simulation model is general and can be used to study many types of discrete manufacturing.
  • Keywords
    Assembly; Circuit testing; Discrete event simulation; Fabrication; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit testing; Production facilities; Semiconductor device modeling; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9472
  • Type

    jour

  • DOI
    10.1109/TSMC.1987.289336
  • Filename
    4075658