• DocumentCode
    1054789
  • Title

    Stepwise equivalent conductance circuit simulation technique

  • Author

    Lin, Shen ; Kuh, Ernest S. ; Marek-Sadowska, M.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    12
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    672
  • Lastpage
    683
  • Abstract
    A circuit simulation technique based on a stepwise equivalent conductance model of a nonlinear resistive device is introduced. The major advantage of this technique is that it eliminates the need to employ Newton-Raphson iterations for the implicit integration. The technique, when applicable, is consistent, absolutely stable, and convergent. It is demonstrated that a second order of accuracy (the local truncation error for integration is of the cubic order of the time step used) is achieved by solving linear equations for each integration step. When applied to digital MOS circuits, the technique takes advantage of the fact that voltage waveforms can be modeled to a good approximation as piecewise-linear functions and thus provides further speedup in the simulation. The program, called SWEC, has been implemented, and has proved to be accurate and efficient on a large number of circuit examples. The results are compared with those for Relax2.3.iSPLICE3.0 XPsim. and SPECS2
  • Keywords
    circuit analysis computing; digital integrated circuits; equivalent circuits; SWEC; conductance circuit simulation technique; convergent; digital MOS circuits; integration; linear equations; local truncation error; nonlinear resistive device; piecewise-linear functions; stepwise equivalent conductance model; Circuit simulation; Computational modeling; Coupling circuits; Dairy products; Finite wordlength effects; Piecewise linear techniques; SPICE; Timing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.277612
  • Filename
    277612