DocumentCode :
1054789
Title :
Stepwise equivalent conductance circuit simulation technique
Author :
Lin, Shen ; Kuh, Ernest S. ; Marek-Sadowska, M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
12
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
672
Lastpage :
683
Abstract :
A circuit simulation technique based on a stepwise equivalent conductance model of a nonlinear resistive device is introduced. The major advantage of this technique is that it eliminates the need to employ Newton-Raphson iterations for the implicit integration. The technique, when applicable, is consistent, absolutely stable, and convergent. It is demonstrated that a second order of accuracy (the local truncation error for integration is of the cubic order of the time step used) is achieved by solving linear equations for each integration step. When applied to digital MOS circuits, the technique takes advantage of the fact that voltage waveforms can be modeled to a good approximation as piecewise-linear functions and thus provides further speedup in the simulation. The program, called SWEC, has been implemented, and has proved to be accurate and efficient on a large number of circuit examples. The results are compared with those for Relax2.3.iSPLICE3.0 XPsim. and SPECS2
Keywords :
circuit analysis computing; digital integrated circuits; equivalent circuits; SWEC; conductance circuit simulation technique; convergent; digital MOS circuits; integration; linear equations; local truncation error; nonlinear resistive device; piecewise-linear functions; stepwise equivalent conductance model; Circuit simulation; Computational modeling; Coupling circuits; Dairy products; Finite wordlength effects; Piecewise linear techniques; SPICE; Timing; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.277612
Filename :
277612
Link To Document :
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