DocumentCode
1054889
Title
Introduction to the Special Issue on 2008 International Integrated Reliability Workshop (IIRW)
Author
Tao, G. ; Lenahan, P. ; Haase, Gundolf ; Young, Cliff ; Strong, A.
Volume
9
Issue
2
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
104
Lastpage
105
Abstract
The five papers in this special issue were selected from the IEEE International Integrated Reliability Workshop (IIRW) 2008, held on October 12-16, 2008, near South Lake Tahoe, CA.
Keywords
Circuits; Conferences; High K dielectric materials; High-K gate dielectrics; Lakes; Materials reliability; Niobium compounds; Plasma temperature; Special issues and sections; Titanium compounds;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2009.2020526
Filename
5062531
Link To Document