IVB-5 effect of interface traps on the GaAs planar devices
Author :
Tanimoto, Masahiro ; Suzuki, Kenji ; Itoh, Takayuki ; Ikoma, Takashi ; Yanai, H. ; Kaufmann, L.M.F. ; Heime, K.
Volume :
23
Issue :
11
fYear :
1976
fDate :
11/1/1976 12:00:00 AM
Firstpage :
1258
Lastpage :
1259
Keywords :
Current density; Current measurement; Density measurement; Electron traps; Energy measurement; Etching; Gallium arsenide; Pulse measurements; Time measurement; Voltage;
