Title :
A 34 MB/s MLC Write Throughput 16 Gb NAND With All Bit Line Architecture on 56 nm Technology
Author :
Cernea, Raul-Adrian ; Pham, Long ; Moogat, Farookh ; Chan, Siu ; Le, Binh ; Li, Yan ; Tsao, Shouchang ; Tseng, Tai-Yuan ; Nguyen, Khanh ; Li, Jason ; Hu, Jayson ; Yuh, Jong Hak ; Hsu, Cynthia ; Zhang, Fanglin ; Kamei, Teruhiko ; Nasu, Hiroaki ; Kliza, Phi
Author_Institution :
NAND Design Dept., SanDisk Corp., Milpitas, CA
Abstract :
A 16 Gb 4-state MLC NAND flash memory augments the sustained program throughput to 34 MB/s by fully exercising all the available cells along a selected word line and by using additional performance enhancement modes. The same chip operating as an 8 Gb SLC device guarantees over 60 MB/s programming throughput. The newly introduced all bit line (ABL) architecture has multiple advantages when higher performance is targeted and it was made possible by adopting the ldquocurrent sensingrdquo (as opposed to the mainstream ldquovoltage sensingrdquo) technique. The general chip architecture is presented in contrast to a state of the art conventional circuit and a double size data buffer is found to be necessary for the maximum parallelism attained. Further conceptual changes designed to counterbalance the area increase are presented, hierarchical column architecture being of foremost importance. Optimization of other circuits, such as the charge pump, is another example. Fast data access rate is essential, and ways of boosting it are described, including a new redundancy scheme. ABL contribution to energy saving is also acknowledged.
Keywords :
NAND circuits; buffer storage; flash memories; NAND flash memory; all bit line architecture; bit rate 34 Mbit/s; current sensing; data access rate; data buffer; hierarchical column architecture; memory size 16 GByte; multilevel cells chip; size 56 nm; Boosting; Charge pumps; Circuits; Computer buffers; Encoding; Flash memory; Partitioning algorithms; Throughput; 4-state; 56 nm; All bitline (ABL); MLC chip; NAND; architecture; current sensing; flash memory; performance; throughput;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2007152