Title : 
Numerical investigation of turn-on conditions in TRAPATT oscillators
         
        
            Author : 
Bogan, Zeev ; Frey, Jeffrey
         
        
            Author_Institution : 
Wright-Patterson Air Force Base, OH
         
        
        
        
        
            fDate : 
2/1/1977 12:00:00 AM
         
        
        
        
            Abstract : 
A computer simulation of TRAPATT diode-circuit interactions has been used to study high-frequency oscillatory phenomena that are seen experimentally to occur simultaneously with TRAPATT initiation. The simulation combines a solution of the diode internal dynamics using the method of characteristics with a time-domain coaxial-circuit analysis. By determining its dependence on circuit and diode bias conditions, the high-frequency oscillation is shown to be a relaxation, not an IMPATT oscillation. The relaxation oscillation can be tuned by adjusting to TRAPATT bias current to minimize TRAPATT start-up time. A two-step (high-low) bias pulse, or ingenious utilization of ringing in the bias circuit, can also be used to minimize start-up time.
         
        
            Keywords : 
Analytical models; Circuit simulation; Coaxial components; Computational modeling; Computer simulation; Diodes; Electron traps; Frequency; Oscillators; Voltage;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1977.18691