DocumentCode :
1055565
Title :
Numerical investigation of turn-on conditions in TRAPATT oscillators
Author :
Bogan, Zeev ; Frey, Jeffrey
Author_Institution :
Wright-Patterson Air Force Base, OH
Volume :
24
Issue :
2
fYear :
1977
fDate :
2/1/1977 12:00:00 AM
Firstpage :
128
Lastpage :
135
Abstract :
A computer simulation of TRAPATT diode-circuit interactions has been used to study high-frequency oscillatory phenomena that are seen experimentally to occur simultaneously with TRAPATT initiation. The simulation combines a solution of the diode internal dynamics using the method of characteristics with a time-domain coaxial-circuit analysis. By determining its dependence on circuit and diode bias conditions, the high-frequency oscillation is shown to be a relaxation, not an IMPATT oscillation. The relaxation oscillation can be tuned by adjusting to TRAPATT bias current to minimize TRAPATT start-up time. A two-step (high-low) bias pulse, or ingenious utilization of ringing in the bias circuit, can also be used to minimize start-up time.
Keywords :
Analytical models; Circuit simulation; Coaxial components; Computational modeling; Computer simulation; Diodes; Electron traps; Frequency; Oscillators; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18691
Filename :
1478883
Link To Document :
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