• DocumentCode
    1055791
  • Title

    Influence of Insulator Length on the Downstream Electron Temperature and Density in the Coaxial Plasma Focus Device

  • Author

    Hong, Young June ; Oh, Phil Yong ; Moon, Min Wug ; Shin, Hee Myung ; Seo, Yoonho ; Cho, Guangsup ; Choi, Eun Ha

  • Author_Institution
    Dept. of Electrophys., Kwangwoon Univ., Seoul
  • Volume
    37
  • Issue
    1
  • fYear
    2009
  • Firstpage
    184
  • Lastpage
    189
  • Abstract
    We have generated the Ar plasma in the diode chamber based on the established coaxial electrode type and investigated the emitted visible light for emission spectroscopy. The optical emission spectrum data have been obtained for the focused plasma in the cylindrical diode chamber under the input voltage of 4.5 kV and pressure of 40 mtorr. We observed the nine emission lines of Ar II: 407.3, 410.6, 422.4, 426.8, 427.9, 435.0, 438.1, 444.5, and 488.0 nm. The downstream electron temperature and density have been measured by the Boltzmann plot and Stark broadening, respectively, from the assumption of local thermodynamic equilibrium. The length of the acrylic insulator has been changed to 30, 40, and 45 mm, respectively, which is covered on the inner cathode surface, to investigate the influence of insulator length on the downstream electron temperature and density in this experiment. Our results show that the downstream electron temperature and density of focused plasma are 2.5 eV and 1.6times1016 cm-3, respectively, for the coaxial plasma focus with cylindrical electrodes at the insulator length of 40 mm.
  • Keywords
    argon; plasma density; plasma devices; plasma focus; plasma temperature; plasma thermodynamics; Ar; Boltzmann plot; Stark broadening; acrylic insulator length; coaxial plasma focus device; cylindrical diode chamber; downstream electron temperature; electron density; emission spectroscopy; optical emission spectrum; pressure 40 mtorr; thermodynamic equilibrium; voltage 4.5 kV; wavelength 407.3 nm; wavelength 410.6 nm; wavelength 422.4 nm; wavelength 426.8 nm; wavelength 427.9 nm; wavelength 435.0 nm; wavelength 438.1 nm; wavelength 444.5 nm; wavelength 488.0 nm; Argon; Coaxial components; Diodes; Electrodes; Electrons; Insulation; Plasma density; Plasma devices; Plasma measurements; Plasma temperature; Boltzmann plot and Stark broadening; coaxial plasma focus with cylindrical electrodes; downstream electron temperature and density; length of acrylic insulator;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.2006614
  • Filename
    4735615