• DocumentCode
    1056166
  • Title

    An Agile VCO Frequency Calibration Technique for a 10-GHz CMOS PLL

  • Author

    Lin, Tsung-Hsien ; Lai, Yu-Jen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    42
  • Issue
    2
  • fYear
    2007
  • Firstpage
    340
  • Lastpage
    349
  • Abstract
    This paper reports an agile VCO frequency calibration technique and its application on a 10-GHz CMOS integer-N phase-locked loop. The proposed calibration method accomplishes efficient search for an optimum VCO discrete tuning curve among a group of frequency sub-bands. The agility is attributed to a proposed frequency comparison technique which is based on measuring the period difference between two signals. Other mixed-signal circuits are also developed to facilitate this approach. The PLL incorporating the proposed calibration technique is implemented in a 0.18-mum CMOS process. The measured PLL phase noise at 10 GHz is -102 dBc/Hz at 1-MHz offset frequency and the reference spurs are lower than -48 dBc. The PLL consumes 44 mW in the low-current mode. The calibration time is less than 4mus
  • Keywords
    CMOS integrated circuits; calibration; frequency synthesizers; phase detectors; phase locked loops; phase noise; voltage-controlled oscillators; 0.18 micron; 10 GHz; 44 mW; CMOS integrated circuits; CMOS phase locked loop; agile VCO frequency calibration; discrete tuning curve; frequency synthesizer; mixed-signal circuits; period-based frequency comparison; phase detector; phase noise; voltage controlled oscillators; CMOS process; Calibration; Circuit optimization; Frequency measurement; Noise measurement; Phase locked loops; Phase measurement; Phase noise; Tuning; Voltage-controlled oscillators; CMOS integrated circuits; Calibration; frequency synthesizer; period-based frequency comparison; phase detector; phase-locked loop (PLL); voltage-controlled oscillator (VCO);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.889360
  • Filename
    4077165