• DocumentCode
    1056213
  • Title

    Crosstalk Countermeasures for High-Density Inductive-Coupling Channel Array

  • Author

    Miura, Noriyuki ; Sakurai, Takayasu ; Kuroda, Tadahiro

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama
  • Volume
    42
  • Issue
    2
  • fYear
    2007
  • Firstpage
    410
  • Lastpage
    421
  • Abstract
    Inductive coupling among stacked chips in a package enables 1 Gb/s/channel data communications. Array arrangement of the channel increases data bandwidth, while signal may be degraded by crosstalk. In this paper, crosstalk is measured and analyzed, and crosstalk countermeasures are discussed. Received signal waveforms through the inductive coupling are measured by embedded voltage detectors on a test chip. Interference-to-signal ratio (ISR) has good agreement between the measurements and calculations. It is found that crosstalk is reduced negligibly at a certain distance. If the channels are arranged at intervals of this distance, ISR is minimized. A technique based on time interleaving is also proposed to further reduce crosstalk. A 3times17 channel array is implemented with the crosstalk countermeasures. The channel pitch is taken down to 50 mum. Inter-chip communication with data rate of 1 Gb/s/channel and bit error rate (BER) lower than 10-9 is demonstrated
  • Keywords
    crosstalk; error statistics; integrated circuit design; integrated circuit interconnections; system-in-package; bit error rate; crosstalk countermeasures; data bandwidth; data communications; embedded voltage detectors; high-density inductive-coupling channel array; inter-chip communication; interference-to-signal ratio; received signal waveforms; stacked chips; time interleaving; Bandwidth; Bit error rate; Crosstalk; Data communication; Degradation; Detectors; Packaging; Semiconductor device measurement; Testing; Voltage measurement; Crosstalk; SiP; inductor; three-dimensional; wireless interconnect;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.889354
  • Filename
    4077169