Title :
Test results on an MNOS memory array
Author :
Schuermeyer, Fritz L.
Author_Institution :
Wright-Patterson Air Force Base, OH
fDate :
5/1/1977 12:00:00 AM
Abstract :
The NCR 2050 MNOS memory chip, developed under Air Force contract for frequency-preset applications in communications equipment, has been tested and evaluated. Results on retentivity, writing characteristics, pattern sensitivity, and endurance are presented.
Keywords :
Algorithms; Circuit testing; Clocks; Equations; Logic; Performance evaluation; Read-write memory; Threshold voltage; Timing; Writing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18779
