DocumentCode
1056450
Title
Test results on an MNOS memory array
Author
Schuermeyer, Fritz L.
Author_Institution
Wright-Patterson Air Force Base, OH
Volume
24
Issue
5
fYear
1977
fDate
5/1/1977 12:00:00 AM
Firstpage
564
Lastpage
568
Abstract
The NCR 2050 MNOS memory chip, developed under Air Force contract for frequency-preset applications in communications equipment, has been tested and evaluated. Results on retentivity, writing characteristics, pattern sensitivity, and endurance are presented.
Keywords
Algorithms; Circuit testing; Clocks; Equations; Logic; Performance evaluation; Read-write memory; Threshold voltage; Timing; Writing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18779
Filename
1478971
Link To Document