DocumentCode
1056618
Title
IMPATT device simulation and properties
Author
Bauhahn, Paul ; Haddad, George I.
Author_Institution
University of Michigan, Ann Arbor, MI
Volume
24
Issue
6
fYear
1977
fDate
6/1/1977 12:00:00 AM
Firstpage
634
Lastpage
642
Abstract
The purpose of this paper is to shed further light on the operating characteristics and limitations of IMPATT diodes, particularly those with Read or modified Read structures. This has been achieved by developing efficient and economical computer Programs which incorporate all of the important material parameters and doping profiles in an exact manner. These computer programs are then employed to study the properties of high-efficiency Si and GaAs structures. Some very interesting properties of these devices and the effects of material parameters and doping profiles on their performance are presented and discussed. This leads to a better understanding of these devices and their limitations. Preliminary calculations have also been carried out on an InP IMPATT diode and the results are presented.
Keywords
Computational modeling; Computer simulation; Costs; Degradation; Diodes; Doping profiles; Electrons; Gallium arsenide; Radio frequency; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18795
Filename
1478987
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