• DocumentCode
    1056618
  • Title

    IMPATT device simulation and properties

  • Author

    Bauhahn, Paul ; Haddad, George I.

  • Author_Institution
    University of Michigan, Ann Arbor, MI
  • Volume
    24
  • Issue
    6
  • fYear
    1977
  • fDate
    6/1/1977 12:00:00 AM
  • Firstpage
    634
  • Lastpage
    642
  • Abstract
    The purpose of this paper is to shed further light on the operating characteristics and limitations of IMPATT diodes, particularly those with Read or modified Read structures. This has been achieved by developing efficient and economical computer Programs which incorporate all of the important material parameters and doping profiles in an exact manner. These computer programs are then employed to study the properties of high-efficiency Si and GaAs structures. Some very interesting properties of these devices and the effects of material parameters and doping profiles on their performance are presented and discussed. This leads to a better understanding of these devices and their limitations. Preliminary calculations have also been carried out on an InP IMPATT diode and the results are presented.
  • Keywords
    Computational modeling; Computer simulation; Costs; Degradation; Diodes; Doping profiles; Electrons; Gallium arsenide; Radio frequency; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18795
  • Filename
    1478987