DocumentCode :
1056618
Title :
IMPATT device simulation and properties
Author :
Bauhahn, Paul ; Haddad, George I.
Author_Institution :
University of Michigan, Ann Arbor, MI
Volume :
24
Issue :
6
fYear :
1977
fDate :
6/1/1977 12:00:00 AM
Firstpage :
634
Lastpage :
642
Abstract :
The purpose of this paper is to shed further light on the operating characteristics and limitations of IMPATT diodes, particularly those with Read or modified Read structures. This has been achieved by developing efficient and economical computer Programs which incorporate all of the important material parameters and doping profiles in an exact manner. These computer programs are then employed to study the properties of high-efficiency Si and GaAs structures. Some very interesting properties of these devices and the effects of material parameters and doping profiles on their performance are presented and discussed. This leads to a better understanding of these devices and their limitations. Preliminary calculations have also been carried out on an InP IMPATT diode and the results are presented.
Keywords :
Computational modeling; Computer simulation; Costs; Degradation; Diodes; Doping profiles; Electrons; Gallium arsenide; Radio frequency; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18795
Filename :
1478987
Link To Document :
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