DocumentCode
1056804
Title
A process and layout-oriented short-channel MOST model for circuit-analysis programs
Author
Compeers, Jef ; De Man, Hugo J. ; Sansen, Willy M C
Author_Institution
Catholic University of Leuven, Leuven, Belgium
Volume
24
Issue
6
fYear
1977
fDate
6/1/1977 12:00:00 AM
Firstpage
739
Lastpage
746
Abstract
A new static model for the saturation region of short-channel MOST´s is presented for use in circuit-analysis programs. In addition to the finite lateral electric field at the channel end and the presence of mobile carriers in the depletion region, it takes into account an effective surface concentration and the Gaussian character of the drain junction profile. At the beginning of the circuit analysis, a preprocessor program, which is based on this new MOST model, derives a fitmodel from the processing data. During the circuit analysis, the fitformulas are adapted to the device geometry. Finally, the model is compared with existing models and with experimental results.
Keywords
Application software; Capacitance; Channel bank filters; Circuit analysis; Electron mobility; Gaussian processes; Geometry; Helium; Neodymium; Threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18813
Filename
1479005
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