DocumentCode :
1056804
Title :
A process and layout-oriented short-channel MOST model for circuit-analysis programs
Author :
Compeers, Jef ; De Man, Hugo J. ; Sansen, Willy M C
Author_Institution :
Catholic University of Leuven, Leuven, Belgium
Volume :
24
Issue :
6
fYear :
1977
fDate :
6/1/1977 12:00:00 AM
Firstpage :
739
Lastpage :
746
Abstract :
A new static model for the saturation region of short-channel MOST´s is presented for use in circuit-analysis programs. In addition to the finite lateral electric field at the channel end and the presence of mobile carriers in the depletion region, it takes into account an effective surface concentration and the Gaussian character of the drain junction profile. At the beginning of the circuit analysis, a preprocessor program, which is based on this new MOST model, derives a fitmodel from the processing data. During the circuit analysis, the fitformulas are adapted to the device geometry. Finally, the model is compared with existing models and with experimental results.
Keywords :
Application software; Capacitance; Channel bank filters; Circuit analysis; Electron mobility; Gaussian processes; Geometry; Helium; Neodymium; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18813
Filename :
1479005
Link To Document :
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