Title :
Reliability results on electron bombarded semiconductor power devices
Author :
Bates, D.J. ; True, R.
Author_Institution :
Watkins-Johnson Company, Palo Alto, CA
fDate :
6/1/1977 12:00:00 AM
Abstract :
A number of pulse and CW EBS power amplifiers have undergone extended life test. No failures have been recorded in over 180 000 test hours on eight CW devices, and one failure occurred in 90 000 test hours on eight pulsed devices.
Keywords :
Diodes; Electronic equipment testing; Electrons; Life testing; Power amplifiers; Pulse amplifiers; Pulse measurements; Pulse modulation; Radiofrequency amplifiers; Semiconductor device reliability;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18824
