DocumentCode
1057182
Title
Finite-difference time-domain analysis of flip-chip interconnects with staggered bumps
Author
Ghouz, Hussein H M ; El-Sharawy, El-Badawy
Author_Institution
Dept. of Electr. & Comput. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
44
Issue
6
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
960
Lastpage
963
Abstract
This paper presents finite-difference time-domain (FDTD) analysis of flip-chip interconnects. Transitions between coplanar waveguides on the chip and the mother board are investigated over a broad band of frequency by means of Fourier transform of the time-domain results. Objectives of the analysis include the evaluation of bump reflection and insertion loss as well as the reconfiguration of the transition to improve package performance. Novel designs have been developed and presented to reduce the effects of package discontinuities and asymmetry. Staggering the bumps has been found to reduce reflection and insertion loss over a broad band of frequency. A reduction In bump reflection of up to 8 dB per transition can be achieved by staggering the ground and signal connects. The degradation in package performance due to structure asymmetry is also studied. The present designs have also been found to reduce the effects of flip-chip asymmetry on insertion and reflection losses
Keywords
MMIC; coplanar waveguides; finite difference time-domain analysis; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; losses; Fourier transform; MMIC applications; bump reflection; coplanar waveguide transitions; finite-difference time-domain analysis; flip-chip interconnects; ground connects; insertion loss; package discontinuities; package performance; reflection loss; signal connects; staggered bumps; structure asymmetry; Coplanar waveguides; Finite difference methods; Fourier transforms; Frequency; Insertion loss; Packaging; Performance analysis; Reflection; Time domain analysis; Waveguide transitions;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.506636
Filename
506636
Link To Document