Title :
Intensity Noise in a Wavelength-Locked Fabry–Perot Laser Diode to a Spectrum Sliced ASE
Author :
Park, Kun-youl ; Lee, Chang-Hee
Author_Institution :
Korea Telecomm Network Infra Lab., Daejeon
fDate :
3/1/2008 12:00:00 AM
Abstract :
We derived analytic expression for the relative intensity noise (RIN) of a wavelength-locked Fabry-Perot laser diode (FP LD) in a single mode region. The RIN of the wavelength-locked output is a function of the photon density and the photon life time. It also depends on the wavelength detuning and the injected amplified spontaneous emission (ASE) power. We investigated the modulation transfer function of the wavelength-locked FP LD and its dependence on wavelength detuning. The analytic result has good agreement with the simulation result.
Keywords :
Fabry-Perot interferometers; optical transfer function; semiconductor lasers; Fabry-Perot laser diode; amplified spontaneous emission; modulation transfer function; photon density; photon life time; relative intensity noise; Analytical models; Bandwidth; Costs; Diode lasers; Optical fiber networks; Passive optical networks; Semiconductor device noise; Spontaneous emission; Transfer functions; Wavelength division multiplexing; Incoherent light injection; spectrum sliced ASE; wavelength-division multiplexed passive optical network (WDM-PON); wavelength-locked Fabry–Perot laser diode;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2007.911685
