• DocumentCode
    1057259
  • Title

    High-efficiency GaP green LED´s by Zinc diffusion into an n-LPE layer

  • Author

    Beppu, Tatsuro ; Iwamoto, Masami ; Naito, Makoto ; Kasami, Akinobu

  • Author_Institution
    Tokyo Shibaura Electric Company, Ltd., Kawasaki, Japan
  • Volume
    24
  • Issue
    7
  • fYear
    1977
  • fDate
    7/1/1977 12:00:00 AM
  • Firstpage
    951
  • Lastpage
    955
  • Abstract
    High-efficiency GaP green LED\´s have been developed by zinc diffusion into nitrogen doped n-type liquid phase epitaxial (LPE) layers. The average efficiency for an encapsulated diode is 0.15 percent at 8 A . cm-2and 0.23 percent at 50 A . cm-2. In order to obtain high-efficiency diodes, an optimum nitrogen doping and a long minority carrier lifetime τhin the n-LPE layer are essential. While increasing nitrogen concentration NT, τhhas a constant value up to a certain NTvalue; at higher NTvalues τhdegrades proportionally to N_{T}^{-2} . The minority carrier lifetime in the low NTregion also depends strongly on the dislocation density of the n-LPE layer. For crystals with a dislocation density less than 2 × 105cm-2, a nitrogen concentration of about 6 × 1017cm-3gives an optimum diode efficiency. A diffusion process, minimizing the deterioration of the n-LPE crystal quality, is also important. A low temperature (600-700°C) diffusion at an optimum phosphorus pressure has been developed.
  • Keywords
    Charge carrier lifetime; Crystals; Degradation; Doping; Electrodes; Light emitting diodes; Nitrogen; P-n junctions; Temperature measurement; Zinc;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18857
  • Filename
    1479049