Test stand for the Silicon Vertex Detector of the Collider Detector Facility

Author

Zimmermann, S. ; Anderson, J. ; Andresen, J. ; Barsotti, E. ; Chramowicz, J. ; Duerling, G. ; Gao, M. ; Gonzalez, H. ; Haynes, B. ; Knopf, W. ; Treptow, K. ; Walsh, D. ; Zmuda, T. ; Huffman, T. ; Shepard, P. ; Gay, C. ; Harder, S. ; Hill, H. ; Huth, J. ;

Author_Institution

Fermi Nat. Accel. Lab., Batavia, IL, USA

Volume

43

Issue

3

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

1170

Lastpage

1174

Abstract

A test stand for the next generation of the Silicon Vertex Detector (SVX-II) of the Collider Detector Facility (CDF) at Fermilab has been developed. It is capable of performing cosmic ray, beam, and laser pulsing tests on silicon strip detectors using the new generation of SVX chips. The test stand is composed of a SGI workstation, a VME CPU, the Silicon Test Acquisition and Readout (STAR) board, the Test Fiber Interface Board (TFIB), and the Test Port Card (TPC). The STAR mediates between external stimuli for the different tests and produces appropriate high level commands which are sent to the TFIB. The TFIB, in conjunction with the TPC, translates these commands into the correct logic levels to control the SVX chips. The four modes of operation of the SVX chips are configuration, data acquisition, digitization, and data readout. The data read out from the SVX chips is transferred to the STAR. The STAR can then be accessed by the VME CPU and the SGI workstation for future analyses. The detailed description of this test stand will be given

Keywords

automatic test equipment; data acquisition; silicon radiation detectors; CDF; Collider Detector Facility; SGI workstation; STAR board; SVX chip; Si; Si strip detectors; Silicon Vertex Detector; Test Fiber Interface Board; Test Port Card; VME CPU; configuration; data acquisition; data readout; digitization; test stand; Data acquisition; Detectors; Fiber lasers; Laser beams; Logic; Optical fiber testing; Performance evaluation; Silicon; Strips; Workstations;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.506658

Filename

506658