BPSK Bit Error Outage over Nakagami-m Fading Channels in Lognormal Shadowing Environments

Author

Mary, Philippe ; Dohler, Mischa ; Gorce, Jean-Marie ; Villemaud, Guillaume ; Arndt, Marylin

Author_Institution

France Telecom R&D, Meylan

Volume

11

Issue

7

fYear

2007

fDate

7/1/2007 12:00:00 AM

Firstpage

565

Lastpage

567

Abstract

In this letter, we address the problem of finding a tractable expression for the bit-error outage (BEO) defined as the probability to observe a given average bit error rate (BER) over a fading channel in a shadowing environment. Our contribution is two-fold: (1) a simple yet tight approximation of the bit error probability (BEP) for binary phase shift keying (BPSK) over a frequency-flat Nakagami-m fading channel is derived, which (2) facilitates the derivation of a tight lower bound of the BEO in presence of lognormal shadowing in closed form. Theoretical results are corroborated by means of simulation results, confirming the tightness of the bounds.

Keywords

error statistics; fading channels; phase shift keying; probability; BPSK; Nakagami-m fading channels; binary phase shift keying; bit error outage; bit error probability; bit error rate; lognormal shadowing environments; tractable expression; Binary phase shift keying; Bit error rate; Closed-form solution; Error probability; Fading; Frequency shift keying; Helium; Mobile communication; Shadow mapping; Wireless communication;

fLanguage

English

Journal_Title

Communications Letters, IEEE

Publisher

ieee

ISSN

1089-7798

Type

jour

DOI

10.1109/LCOMM.2007.070241

Filename

4273762