• DocumentCode
    1057584
  • Title

    Bandgap narrowing in silicon bipolar transistors

  • Author

    Slotboom, J.W. ; de Graaff, H.C.

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • Volume
    24
  • Issue
    8
  • fYear
    1977
  • fDate
    8/1/1977 12:00:00 AM
  • Firstpage
    1123
  • Lastpage
    1125
  • Abstract
    Martinelli [1] recently reported on measurements of the I-V characteristics of silicon bipolar transistors as a function of temperature. His conclusion was that there was no evidence of bandgap narrowing in the transistors. Our experiments [2] on n-p-n transistors indicate that the bandgap does narrow for impurity concentrations above N = 10^{17} cm-3. The reason for this discrepancy follows from Martinelli\´s assumption that the temperature dependence of the minority carrier mobility in the p-type base is given by T-2.6, independently of the impurity concentration, which is not justified by our measurements.
  • Keywords
    Bipolar transistors; Current measurement; Displays; Doping; Electrodes; Gain measurement; Impurities; Photonic band gap; Silicon; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18889
  • Filename
    1479081