DocumentCode :
1058082
Title :
Two-Port Vector Network Analyzer Measurements Up to 508 GHz
Author :
Fung, Andy ; Samoska, Lorene ; Chattopadhyay, Goutam ; Gaier, Todd ; Kangaslahti, Pekka ; Pukala, David ; Oleson, Charles ; Denning, Anthony ; Lau, Yuenie
Author_Institution :
California Inst. of Technol., Pasadena
Volume :
57
Issue :
6
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1166
Lastpage :
1170
Abstract :
We present new results for a two-port vector network analyzer swept-frequency test set for the 325-508 GHz frequency band. The calibrated dynamic range performance in the full frequency band is discussed. Using a line-reflect-line calibration procedure, the dynamic ranges for return and insertion losses of better than 20 and 35 dB, respectively, are achieved. We examine the performance of the calibrated test set for the first time by measuring S-parameters of passive waveguide components and comparing data with electromagnetic simulations.
Keywords :
S-parameters; microwave measurement; network analysers; two-port networks; waveguide components; S-parameters; electromagnetic simulations; line-reflect-line calibration procedure; two-port vector network analyzer measurements; waveguide components; MMICs; Measurement; millimeter-wave measurements; monolithic microwave integrated circuit (MMIC) amplifiers; scattering parameter measurement; submillimeter-wave amplifiers; submillimeter-wave circuits; submillimeter-wave measurements; submillimeter-wave technology; submillimeter-wave transistors; submillimeter-wave waveguides;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.915125
Filename :
4446605
Link To Document :
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