Two-Port Vector Network Analyzer Measurements Up to 508 GHz

Author

Fung, Andy ; Samoska, Lorene ; Chattopadhyay, Goutam ; Gaier, Todd ; Kangaslahti, Pekka ; Pukala, David ; Oleson, Charles ; Denning, Anthony ; Lau, Yuenie

Author_Institution

California Inst. of Technol., Pasadena

Volume

57

Issue

6

fYear

2008

fDate

6/1/2008 12:00:00 AM

Firstpage

1166

Lastpage

1170

Abstract

We present new results for a two-port vector network analyzer swept-frequency test set for the 325-508 GHz frequency band. The calibrated dynamic range performance in the full frequency band is discussed. Using a line-reflect-line calibration procedure, the dynamic ranges for return and insertion losses of better than 20 and 35 dB, respectively, are achieved. We examine the performance of the calibrated test set for the first time by measuring S-parameters of passive waveguide components and comparing data with electromagnetic simulations.

Keywords

S-parameters; microwave measurement; network analysers; two-port networks; waveguide components; S-parameters; electromagnetic simulations; line-reflect-line calibration procedure; two-port vector network analyzer measurements; waveguide components; MMICs; Measurement; millimeter-wave measurements; monolithic microwave integrated circuit (MMIC) amplifiers; scattering parameter measurement; submillimeter-wave amplifiers; submillimeter-wave circuits; submillimeter-wave measurements; submillimeter-wave technology; submillimeter-wave transistors; submillimeter-wave waveguides;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.915125

Filename

4446605